Conference chairs:
Daniel Alquier (University of Tours – GREMAN, FRANCE)
Jean-François Michaud (University of Tours – GREMAN, FRANCE)
Dominique Planson (INSA Lyon – AMPERE, FRANCE)
ECSCRM steering committee:
Daniel Alquier (University of Tours, FRANCE)
Danilo Crippa (LPE, ITALY)
Michael Dudley (Stony Brook University, NY, USA)
Gabriel Ferro (Université Claude Bernard, Lyon, FRANCE)
Adam Gali (Budapest University of Technology and Economics, HUNGARY)
Tsunenobu Kimoto (Kyoto University, JAPAN)
Michael Krieger (Friedrich-Alexander Universitat Erlangen-Nürnberg, GERMANY)
Alexander Lebedev (Ioffe Institute, St Petersburg, RUSSIA)
Phil Mawby (University of Warwick, UNITED KINGDOM)
Dethard Peters (Infineon Technologies, GERMANY)
Dominique Planson (National Institute of Applied Sciences, Lyon, FRANCE)
Fabrizio Roccaforte (National Research Council Catania, ITALY)
Adolf Schöner (Ascatron, SWEDEN)
Konstantinos Zekentes (Foundation for Research and Technology, Heraklion, GREECE)
ECSCRM advisory panel:
Peter Deak
Phillipe Godignon (Centro Nacional de Microelectronica, Barcelona, SPAIN)
Hiroyuki Matsunami
Roberta Nipoti (CNR-IMM, ITALY)
Roland Rupp
John Stoemenos
Local organizing committee:
Jérôme Billoue (University of Tours – GREMAN, FRANCE)
Emmanuel Collard (STMicroelectronics Tours, FRANCE)
Thomas Defforge (INSA CVL – GREMAN, FRANCE)
Gaël Gautier (INSA CVL – GREMAN, FRANCE)
Kevin Nadaud (University of Tours – GREMAN, FRANCE)
Luong Viêt PHUNG (INSA Lyon – AMPERE, FRANCE)
Arnaud YVON (STMicroelectronics Tours, FRANCE)
PCO, website & communication:
Operated By VERT COM
Secretary:
Magali Léger (University of Tours – GREMAN, FRANCE)
Award committee:
Daniel Alquier (University of Tours, FRANCE)
Alberto Castellazzi (University of Kyoto, JAPAN)
Michael Dudley (Stony Brook University, UNITED STATES)
Andrea Irace (University of Napoli, ITALY)
Phil Mawby (University of Warwick, UNITED KINGDOM)
Jean-François Michaud (University of Tours, FRANCE)
Technical Program Committee:
Materials:
Marc Portail (CRHEA-CNRS, FRANCE)
Gabriel Ferro (Universite Claude Bernard, Lyon, FRANCE)
Didier Chaussende (SIMAP-CNRS, Grenoble)
Francesco la Via (CNR-IMM, National Research Council, Catania, ITALY)
Alexander Lebedev (Ioffe Institute, St Petersburg, RUSSIA)
Adolf Schoner (Ascatron, SWEDEN)
Al Burk (Wolfspeed, A Cree Company, USA)
Hidekazu Tsuchida (CRIEPI, Japan)
Danilo Crippa (LPE, Italy)
Characterization and modeling:
Jean-François Michaud (Univ. Tours, FRANCE)
Arnaud Yvon (STMicroelectronics, Tours, FRANCE)
Peder Bergman (Linkoping University, SWEDEN)
Michael Dudley (Stony Brook University, USA)
Adam Gali (Budapest University of Technology and Economics, HUNGARY)
Michael Krieger (Friedrich-Alexander-Universitat Erlangen, Nuremburg, GERMANY)
Tsunenobu Kimoto (Kyoto University, JAPAN)
Ulrike Grossner (ETH, SWITZERLAND)
Processing:
Daniel Alquier (University of Tours, FRANCE)
Wolfgang Bergner (Infineon Technologies, AUSTRIA )
Peter Gammon (University of Warwick, UK)
Roberta Nipoti (CNR-IMM (Bologna), ITALY)
Fabrizio Roccaforte (CNR-IMM, National Research Council Catania, ITALY)
Hiroshi Yano (Univ. Tsukuba, JAPAN)
Konstantinos Zekentes (Foundation for Research and Technology, Heraklion, GREECE)
Devices and applications:
Dominique Planson (INSA Lyon, National Institute of Applied Sciences, Lyon, FRANCE)
Emmanuel Collard (STMicroelectronics, Tours, FRANCE)
Luong Viêt Phung (INSA Lyon, National Institute of Applied Sciences, Lyon, FRANCE)
Alberto Castellazzi (Kyoto University of Advanced Science, JAPAN)
Phillipe Godignon (CNM, Centro Nacional de Microelectronica, Barcelona, SPAIN)
Andrea Irace (University of Naples Federico II, ITALY)
Phil Mawby (University of Warwick, UK)
Dethard Peters (Infineon Technologies, GERMANY)
Mario Saggio (ST, Catania, ITALY)
Yoshiyuki Yonezawa (AIST, JAPAN)
Andrei Mihaila (ABB, Zurich, SWITZERLAND)